PC-Based Current Decay Machine Installed For 2015 F150 Low Series Light Testing

Computer Based System with Dynamic Inrush Detection Provides Vast Improvement

3/30/2014 - Sandusky, Ohio

A new invention has been successfully launched for testing incandescent bulbs. The test has historically been done in a PLC which provides many limitations. The new PC-Based system is an industrial embedded computer using the latest in Microsoft database and software coding. Curve fingerprints for each test are now stored and can quickly be retrieved and displayed. The biggest improvement deals with the proprietary algorithm for determining when to start the test. The "Dynamic Inrush Detection" algorithm makes the actual time to test an inconsistent variable instead of the test result. Initial results suggest the new CD-100 product is a quantum leap in Automotive Lighting incandescent bulb testing. Ultimately test results are sent to Process Logic Controller (PLC) to pass or fail each part. Team Ray Technologies provided PLC integration and engineering support.